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[Analysis Case] Investigation of Rust Formation Causes on Gear Surface

Investigate the relationship with the cleaning solution used in the project! Concentrate the cleaning solution and analyze it using the transmission method of micro FT-IR!

We would like to introduce the investigation we conducted on the causes of rust formation on gear surfaces. Rust occurred during the gear manufacturing process. We investigated the relationship with the cleaning solution used in the process. By concentrating the cleaning solution and analyzing it using the transmission method of micro FT-IR, we found that the positions of the total infrared absorption bands of the organic matter in the rusted areas of the gear (tooth tips and sides) matched the positions of the infrared absorption bands of the cleaning solution. Additionally, we conducted energy dispersive X-ray analysis on the inorganic components and detected the same elements. 【Case Summary】 ■ Investigation Material: Rust occurrence in the gear manufacturing process, investigating the relationship with the cleaning solution used in the process ■ Cleaning Components: Concentrated the cleaning solution and analyzed it using the transmission method of micro FT-IR ■ Analysis of Rusted Areas of the Gear ■ Results - The positions of the total infrared absorption bands of the organic matter in the rusted areas of the gear (tooth tips and sides) matched the positions of the infrared absorption bands of the cleaning solution. - Conducted energy dispersive X-ray analysis on the inorganic components and detected the same elements. *For more details, please refer to the related links or feel free to contact us.

  • Analytical Equipment and Devices
  • Other environmental analysis equipment
  • Contract Analysis
  • Absorption Analyzer

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[Analysis Case] Quantification of Interstitial Atom Concentration in Silicon Single Crystals

Quantitative analysis of interstitial oxygen and carbon concentration non-destructively using infrared absorption method.

It is possible to non-destructively determine the interstitial oxygen and carbon atom concentrations in silicon single crystals using FT-IR analysis. The concentrations are calculated from the peak heights of the absorption due to interstitial oxygen or carbon in the spectra measured by the transmission method. The calculation method is standardized by the Japan Electronics and Information Technology Industries Association (JEITA). Below are examples of calculated interstitial oxygen atom concentrations.

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Environmental analysis: Analysis of trace foreign substances, adherents, and precipitates.

Analysis of foreign substances in food, contaminants on machine parts, and deposits on electrical contacts!

We accept the identification of foreign substances in food, contaminants on machine parts, and residues on electrical contacts at a low cost, quickly, and accurately. The process is as follows: send materials → confirm analysis details → report results → mail report. 【Features】 ■ FT-IR ○ Heating Melting Method ■ EDS Analysis ■ FT-IR/EDS *Please contact us for other functions and details.

  • Contract Inspection
  • Absorption Analyzer

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